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DETERMINATION OF SURFACE CAPACITY QS AND SUPERFICIAL ACTIVE LAYER THICKNESS dS OF LaNi5 BASED INGOT ELECTRODESDETERMINATION OF SURFACE CAPACITY QS AND SUPERFICIAL ACTIVE LAYER THICKNESS dS OF LaNi5 BASED INGOT ELECTRODES 
Abstract. LaNi4,3–xCoxMn0,4Al0,3 materials (x=0, 0.25, 0.5, 0.75, 1.0) were prepared and examined using XRD technique. Ingot electrodes were formed from these materials for electrochemical studies, namely cyclic voltammetry with different scanning rates n (mV/s). A determination of surface capacity QS of the ingot electrodes was carried out with an extrapolation to in 
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